Home > Publications database > Corrigendum to “Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]” > print

001     902836
005     20220103172038.0
024 7 _ |a 10.1016/j.tsf.2021.138694
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024 7 _ |a 0040-6090
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024 7 _ |a 1879-2731
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024 7 _ |a WOS:000653013100004
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037 _ _ |a FZJ-2021-04593
082 _ _ |a 660
100 1 _ |a Giesen, Margret
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245 _ _ |a Corrigendum to “Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]”
260 _ _ |a Amsterdam [u.a.]
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536 _ _ |a 1212 - Materials and Interfaces (POF4-121)
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700 1 _ |a Jugovac, Matteo
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700 1 _ |a Zamborlini, Giovanni
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700 1 _ |a Feyer, Vitaliy
|0 P:(DE-Juel1)145012
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700 1 _ |a Gunkel, Felix
|0 P:(DE-Juel1)130677
|b 4
700 1 _ |a Mueller, David N.
|0 P:(DE-HGF)0
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|e Corresponding author
773 _ _ |a 10.1016/j.tsf.2021.138694
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|t Thin solid films
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856 4 _ |u https://juser.fz-juelich.de/record/902836/files/1-s2.0-S0040609021001772-main.pdf
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