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@ARTICLE{Martins:902975,
      author       = {Martins, H. P. and Conti, G. and Cordova, I. and Falling,
                      L. and Kersell, H. and Salmassi, F. and Gullikson, E. and
                      Vishik, I. and Baeumer, C. and Naulleau, P. and Schneider,
                      C. M. and Nemsak, S.},
      title        = {{N}ear total reflection x-ray photoelectron spectroscopy:
                      quantifying chemistry at solid/liquid and solid/solid
                      interfaces},
      journal      = {Journal of physics / D},
      volume       = {54},
      number       = {46},
      issn         = {0022-3727},
      address      = {Bristol},
      publisher    = {IOP Publ.},
      reportid     = {FZJ-2021-04721},
      pages        = {464002 -},
      year         = {2021},
      abstract     = {Near total reflection regime has been widely used in x-ray
                      science, specifically in grazing incidence small angle x-ray
                      scattering and in hard x-ray photoelectron spectroscopy
                      (XPS). In this work, we introduce some practical aspects of
                      using near total reflection (NTR) in ambient pressure XPS
                      and apply this technique to study chemical concentration
                      gradients in a substrate/photoresist system. Experimental
                      data are accompanied by x-ray optical and photoemission
                      simulations to quantitatively probe the photoresist and the
                      interface with the depth accuracy of ∼1 nm. Together, our
                      calculations and experiments confirm that NTR XPS is a
                      suitable method to extract information from buried
                      interfaces with highest depth-resolution, which can help
                      address open research questions regarding our understanding
                      of concentration profiles, electrical gradients, and charge
                      transfer phenomena at such interfaces. The presented
                      methodology is especially attractive for solid/liquid
                      interface studies, since it provides all the strengths of a
                      Bragg-reflection standing-wave spectroscopy without the need
                      of an artificial multilayer mirror serving as a standing
                      wave generator, thus dramatically simplifying the sample
                      synthesis.},
      cin          = {PGI-6},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-6-20110106},
      pnm          = {1212 - Materials and Interfaces (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1212},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000695432300001},
      doi          = {10.1088/1361-6463/ac2067},
      url          = {https://juser.fz-juelich.de/record/902975},
}