TY  - CONF
AU  - Han, Yi
AU  - Xi, Fengben
AU  - Allibert, Frederic
AU  - Radu, Ionut
AU  - Prucnal, Slawomir
AU  - Bae, Jin Hee
AU  - Hoffmann-Eifert, Susanne
AU  - Knoch, Joachim
AU  - Grützmacher, Detlev
AU  - Zhao, Qing-Tai
TI  - Impact of the Backgate on the Performance of SOI UTBB nMOSFETs at Cryogenic Temperatures
M1  - FZJ-2021-04975
PY  - 2021
T2  - Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon
CY  - 1 Sep 2021 - 3 Sep 2021, Virtual (France)
Y2  - 1 Sep 2021 - 3 Sep 2021
M2  - Virtual, France
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/903269
ER  -