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@INPROCEEDINGS{Han:903269,
      author       = {Han, Yi and Xi, Fengben and Allibert, Frederic and Radu,
                      Ionut and Prucnal, Slawomir and Bae, Jin Hee and
                      Hoffmann-Eifert, Susanne and Knoch, Joachim and
                      Grützmacher, Detlev and Zhao, Qing-Tai},
      title        = {{I}mpact of the {B}ackgate on the {P}erformance of {SOI}
                      {UTBB} n{MOSFET}s at {C}ryogenic {T}emperatures},
      reportid     = {FZJ-2021-04975},
      year         = {2021},
      month         = {Sep},
      date          = {2021-09-01},
      organization  = {Joint International EuroSOI Workshop
                       and International Conference on
                       Ultimate Integration on Silicon,
                       Virtual (France), 1 Sep 2021 - 3 Sep
                       2021},
      subtyp        = {After Call},
      cin          = {PGI-9},
      cid          = {I:(DE-Juel1)PGI-9-20110106},
      pnm          = {5234 - Emerging NC Architectures (POF4-523)},
      pid          = {G:(DE-HGF)POF4-5234},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/903269},
}