TY  - JOUR
AU  - Alvarez, Agustin O.
AU  - Ravishankar, Sandheep
AU  - Fabregat-Santiago, Francisco
TI  - Combining Modulated Techniques for the Analysis of Photosensitive Devices
JO  - Small methods
VL  - 5
IS  - 10
SN  - 2366-9608
CY  - Weinheim
PB  - WILEY-VCH Verlag GmbH & Co. KGaA
M1  - FZJ-2021-05219
SP  - 2100661 -
PY  - 2021
AB  - Small perturbation techniques such as impedance spectroscopy (IS), intensity-modulated photocurrent spectroscopy (IMPS) and intensity-modulated photovoltage spectroscopy (IMVS) are useful tools to characterize and model the optoelectronic properties of photovoltaic and photoelectrochemical devices. The analysis of the impedance spectra is generally carried out through the modeling of the internal processes occurring in the device with an equivalent circuit. Whereas the analysis of the intensity-modulated spectroscopies is often focused on the characteristic response times that are associated with physical mechanisms such as recombination or transport. In this work, we propose a procedure to analyze photosensitive devices by combining these three techniques. This procedure allows the accurate identification of the common equivalent circuit and the subsequent application to fitting the three spectra. As a result, together with the electrical parameters associated to charge transport, accumulation and recombination, it is possible to obtain optoelectronic parameters such as the charge separation efficiency, external and internal quantum efficiency. Our theoretical approach is experimentally applied in the characterization of a silicon photodiode, illustrating the intrinsical relationship between these techniques. This procedure has a great potential to contribute to the characterization and understanding of the operating principles that govern the response of photoactive devices.
LB  - PUB:(DE-HGF)16
C6  - pmid:34927925
UR  - <Go to ISI:>//WOS:000692464600001
DO  - DOI:10.1002/smtd.202100661
UR  - https://juser.fz-juelich.de/record/903551
ER  -