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@ARTICLE{Xu:904014,
      author       = {Xu, Pengyu and Rheinheimer, Wolfgang and Mishra, Avanish
                      and Shuvo, Shoumya Nandy and Qi, Zhimin and Wang, Haiyan and
                      Dongare, Avinash M. and Stanciu, Lia A.},
      title        = {{O}rigin of {H}igh {I}nterfacial {R}esistance in
                      {S}olid‐{S}tate {B}atteries: {LLTO}/{LCO}
                      {H}alf‐{C}ells**},
      journal      = {ChemElectroChem},
      volume       = {8},
      number       = {10},
      issn         = {2196-0216},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2021-05584},
      pages        = {1847 - 1857},
      year         = {2021},
      abstract     = {The interface between cathode and electrolyte is a
                      significant source of large interfacial resistance in
                      solid-state batteries (SSBs). Spark plasma sintering (SPS)
                      allows densifying electrolyte and electrodes in one step,
                      which can improve the interfacial contact in SSBs and
                      significantly shorten the processing time. In this work, we
                      proposed a two-step joining process to prepare cathode
                      (LiCoO2, LCO)/electrolyte (Li0.33La0.57TiO3, LLTO) half
                      cells via SPS. Interdiffusion between Ti4+/Co3+ was observed
                      at the interface by SEM/STEM, resulting in the formation of
                      the Li−Ti−La−Co−O and Li−Ti−Co−O phases in
                      LLTO and the Li−Co−Ti−O phase in LCO. Computational
                      modeling was performed to verify that the Li−Ti−Co−O
                      phase has a LiTi2O4 host lattice. In a study of interfacial
                      electrical properties, the resistance of this interdiffusion
                      layer was found to be 105 Ω, which is 40 times higher
                      than the resistance of the individual LLTO phase. The
                      formation of an interdiffusion layer is identified as the
                      origin of the high interface resistance in the LLTO/LCO
                      half-cell.},
      cin          = {IEK-1},
      ddc          = {540},
      cid          = {I:(DE-Juel1)IEK-1-20101013},
      pnm          = {1221 - Fundamentals and Materials (POF4-122) / 1222 -
                      Components and Cells (POF4-122)},
      pid          = {G:(DE-HGF)POF4-1221 / G:(DE-HGF)POF4-1222},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000664255800014},
      doi          = {10.1002/celc.202100189},
      url          = {https://juser.fz-juelich.de/record/904014},
}