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@ARTICLE{Byranvand:904098,
      author       = {Byranvand, Mahdi Malekshahi and Saliba, Michael},
      title        = {{D}efect {P}assivation of {P}erovskite {F}ilms for {H}ighly
                      {E}fficient and {S}table {S}olar {C}ells},
      journal      = {Solar RRL},
      volume       = {5},
      number       = {8},
      issn         = {2367-198X},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2021-05668},
      pages        = {2100295 -},
      year         = {2021},
      abstract     = {Perovskite solar cells (PSCs) have been introduced as an
                      attractive photovoltaic technology over the past decade due
                      to their low-cost processing, earth-abundant raw materials,
                      and high power conversion efficiencies (PCEs) of up to
                      $25.2\%.$ However, the relatively high density of defects
                      within the bulk, grain boundaries, and surface of
                      polycrystalline perovskite films acts as recombination
                      centers and facilitates ion migration, lowering the
                      theoretical PCE ceiling, often leading to inferior device
                      stability. Therefore, understanding the defect sources and
                      developing passivation methods are key factors for reaching
                      higher PCEs and stabilities in perovskite photovoltaics.
                      Herein, various passivation methods, including bulk and
                      surface treatment of perovskite films, are explored. In the
                      bulk treatment, the passivating agents should be directly
                      added to the perovskite precursor. However, in the surface
                      treatment method, the surface of perovskite films can be
                      treated by inducing passivating agents during the
                      intermediate phase or after annealing steps, denoted here as
                      in-film or surface posttreatment. In addition, different
                      kinds of passivating agents are categorized based on their
                      functional groups. Finally, the outline directions to
                      minimize the defects in perovskite films are highlighted.},
      cin          = {IEK-5},
      ddc          = {600},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {1212 - Materials and Interfaces (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1212},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000669383600001},
      doi          = {10.1002/solr.202100295},
      url          = {https://juser.fz-juelich.de/record/904098},
}