%0 Journal Article
%A Jugovac, Matteo
%A Menteş, Tevfik Onur
%A Genuzio, Francesca
%A Lachnitt, Jan
%A Feyer, Vitaliy
%A Flege, Jan Ingo
%A Locatelli, Andrea
%T Sensitivity to crystal stacking in low-energy electron microscopy
%J Applied surface science
%V 566
%@ 0169-4332
%C Amsterdam
%I Elsevier
%M FZJ-2021-06150
%P 150656 -
%D 2021
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000691195200002
%R 10.1016/j.apsusc.2021.150656
%U https://juser.fz-juelich.de/record/904580