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%0 Journal Article %A Jugovac, Matteo %A Menteş, Tevfik Onur %A Genuzio, Francesca %A Lachnitt, Jan %A Feyer, Vitaliy %A Flege, Jan Ingo %A Locatelli, Andrea %T Sensitivity to crystal stacking in low-energy electron microscopy %J Applied surface science %V 566 %@ 0169-4332 %C Amsterdam %I Elsevier %M FZJ-2021-06150 %P 150656 - %D 2021 %F PUB:(DE-HGF)16 %9 Journal Article %U <Go to ISI:>//WOS:000691195200002 %R 10.1016/j.apsusc.2021.150656 %U https://juser.fz-juelich.de/record/904580