000904580 001__ 904580
000904580 005__ 20220131120431.0
000904580 0247_ $$2doi$$a10.1016/j.apsusc.2021.150656
000904580 0247_ $$2ISSN$$a0169-4332
000904580 0247_ $$2ISSN$$a1873-5584
000904580 0247_ $$2Handle$$a2128/29875
000904580 0247_ $$2WOS$$aWOS:000691195200002
000904580 037__ $$aFZJ-2021-06150
000904580 082__ $$a660
000904580 1001_ $$0P:(DE-Juel1)169309$$aJugovac, Matteo$$b0$$eCorresponding author
000904580 245__ $$aSensitivity to crystal stacking in low-energy electron microscopy
000904580 260__ $$aAmsterdam$$bElsevier$$c2021
000904580 3367_ $$2DRIVER$$aarticle
000904580 3367_ $$2DataCite$$aOutput Types/Journal article
000904580 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1641380667_24985
000904580 3367_ $$2BibTeX$$aARTICLE
000904580 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000904580 3367_ $$00$$2EndNote$$aJournal Article
000904580 536__ $$0G:(DE-HGF)POF4-5213$$a5213 - Quantum Nanoscience (POF4-521)$$cPOF4-521$$fPOF IV$$x0
000904580 588__ $$aDataset connected to CrossRef, Journals: juser.fz-juelich.de
000904580 7001_ $$00000-0003-0413-9272$$aMenteş, Tevfik Onur$$b1
000904580 7001_ $$0P:(DE-HGF)0$$aGenuzio, Francesca$$b2
000904580 7001_ $$0P:(DE-HGF)0$$aLachnitt, Jan$$b3
000904580 7001_ $$0P:(DE-Juel1)145012$$aFeyer, Vitaliy$$b4
000904580 7001_ $$0P:(DE-HGF)0$$aFlege, Jan Ingo$$b5
000904580 7001_ $$0P:(DE-HGF)0$$aLocatelli, Andrea$$b6
000904580 773__ $$0PERI:(DE-600)2002520-8$$a10.1016/j.apsusc.2021.150656$$gVol. 566, p. 150656 -$$p150656 -$$tApplied surface science$$v566$$x0169-4332$$y2021
000904580 8564_ $$uhttps://juser.fz-juelich.de/record/904580/files/Manuscript.pdf$$yOpenAccess
000904580 909CO $$ooai:juser.fz-juelich.de:904580$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000904580 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145012$$aForschungszentrum Jülich$$b4$$kFZJ
000904580 9131_ $$0G:(DE-HGF)POF4-521$$1G:(DE-HGF)POF4-520$$2G:(DE-HGF)POF4-500$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$9G:(DE-HGF)POF4-5213$$aDE-HGF$$bKey Technologies$$lNatural, Artificial and Cognitive Information Processing$$vQuantum Materials$$x0
000904580 9141_ $$y2021
000904580 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bAPPL SURF SCI : 2019$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)9905$$2StatID$$aIF >= 5$$bAPPL SURF SCI : 2019$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000904580 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2021-01-29
000904580 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz$$d2021-01-29$$wger
000904580 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2021-01-29
000904580 9201_ $$0I:(DE-Juel1)PGI-6-20110106$$kPGI-6$$lElektronische Eigenschaften$$x0
000904580 9801_ $$aFullTexts
000904580 980__ $$ajournal
000904580 980__ $$aVDB
000904580 980__ $$aUNRESTRICTED
000904580 980__ $$aI:(DE-Juel1)PGI-6-20110106