TY - JOUR
AU - Jugovac, Matteo
AU - Menteş, Tevfik Onur
AU - Genuzio, Francesca
AU - Lachnitt, Jan
AU - Feyer, Vitaliy
AU - Flege, Jan Ingo
AU - Locatelli, Andrea
TI - Sensitivity to crystal stacking in low-energy electron microscopy
JO - Applied surface science
VL - 566
SN - 0169-4332
CY - Amsterdam
PB - Elsevier
M1 - FZJ-2021-06150
SP - 150656 -
PY - 2021
LB - PUB:(DE-HGF)16
UR - <Go to ISI:>//WOS:000691195200002
DO - DOI:10.1016/j.apsusc.2021.150656
UR - https://juser.fz-juelich.de/record/904580
ER -