TY  - JOUR
AU  - Jugovac, Matteo
AU  - Menteş, Tevfik Onur
AU  - Genuzio, Francesca
AU  - Lachnitt, Jan
AU  - Feyer, Vitaliy
AU  - Flege, Jan Ingo
AU  - Locatelli, Andrea
TI  - Sensitivity to crystal stacking in low-energy electron microscopy
JO  - Applied surface science
VL  - 566
SN  - 0169-4332
CY  - Amsterdam
PB  - Elsevier
M1  - FZJ-2021-06150
SP  - 150656 -
PY  - 2021
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000691195200002
DO  - DOI:10.1016/j.apsusc.2021.150656
UR  - https://juser.fz-juelich.de/record/904580
ER  -