%0 Journal Article
%A Jannis, Daen
%A Müller-Caspary, Knut
%A Béché, Armand
%A Verbeeck, Jo
%T Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope
%J Applied Sciences
%V 11
%N 19
%@ 2076-3417
%C Basel
%I MDPI
%M FZJ-2022-00246
%P 9058 -
%D 2021
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000710160300001
%R 10.3390/app11199058
%U https://juser.fz-juelich.de/record/904930