TY  - JOUR
AU  - Jannis, Daen
AU  - Müller-Caspary, Knut
AU  - Béché, Armand
AU  - Verbeeck, Jo
TI  - Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope
JO  - Applied Sciences
VL  - 11
IS  - 19
SN  - 2076-3417
CY  - Basel
PB  - MDPI
M1  - FZJ-2022-00246
SP  - 9058 -
PY  - 2021
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000710160300001
DO  - DOI:10.3390/app11199058
UR  - https://juser.fz-juelich.de/record/904930
ER  -