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001     904930
005     20220131120442.0
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100 1 _ |a Jannis, Daen
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245 _ _ |a Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope
260 _ _ |a Basel
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536 _ _ |a ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717)
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536 _ _ |a moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317)
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700 1 _ |a Müller-Caspary, Knut
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700 1 _ |a Béché, Armand
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700 1 _ |a Verbeeck, Jo
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773 _ _ |a 10.3390/app11199058
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|t Applied Sciences
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856 4 _ |u https://juser.fz-juelich.de/record/904930/files/Coincidence%20Detection.pdf
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