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000905191 1001_ $$0P:(DE-Juel1)156312$$aXu, C.$$b0$$eCorresponding author
000905191 245__ $$aIn situ spectroscopic ellipsometry as a pathway toward achieving VO 2 stoichiometry for amorphous vanadium oxide with magnetron sputtering
000905191 260__ $$aNew York, NY$$bAmerican Inst. of Physics$$c2021
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000905191 7001_ $$00000-0002-3340-4576$$aHeinemeyer, F.$$b1
000905191 7001_ $$aDittrich, A.$$b2
000905191 7001_ $$0P:(DE-Juel1)159254$$aBäumer, C.$$b3
000905191 7001_ $$00000-0003-2090-9425$$aReineke-Koch, R.$$b4
000905191 773__ $$0PERI:(DE-600)2583909-3$$a10.1063/5.0041116$$gVol. 11, no. 3, p. 035126 -$$n3$$p035126 -$$tAIP Advances$$v11$$x2158-3226$$y2021
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