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Reliability Aspects of Memristive Devices for Computation-in-Memory Applications
Menzel, S.FZJ* ; Bengel, C.FZJ* ; Mohr, J. ; Wouters, D. ; Wiefels, S.FZJ* ; Cuppers, F.FZJ* ; Hoffmann-Eifert, S. (Corresponding author)FZJ*
2021
IEEE
20212021 17th International Workshop on Cellular Nanoscale Networks and their Applications (CNNA) : [Proceedings] - IEEE, 2021. - ISBN 978-1-6654-3948-0 - doi:10.1109/CNNA49188.2021.9610760
2021 17th International Workshop on Cellular Nanoscale Networks and their Applications (CNNA), CataniaCatania, Italy, 29 Sep 2021 - 1 Oct 20212021-09-292021-10-01
IEEE 1 pp. (2021) [10.1109/CNNA49188.2021.9610760]2021
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Please use a persistent id in citations: doi:10.1109/CNNA49188.2021.9610760
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
- JARA Institut Green IT (PGI-10)
- JARA-FIT (JARA-FIT)
Research Program(s):
- 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
- Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC -, Teilvorhaben: Forschungszentrum Jülich (16ES1133K) (16ES1133K)
- BMBF-16ES1134 - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC - (BMBF-16ES1134) (BMBF-16ES1134)
- Advanced Computing Architectures (aca_20190115) (aca_20190115)
Appears in the scientific report
2021
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