%0 Conference Paper
%A Menzel, Stephan
%T Reliability Modeling of Memristive Devices based on the Valence Change Mechanism
%M FZJ-2022-00746
%D 2021
%B Memrisys 2021
%C 1 Nov 2021 - 4 Nov 2021, Tsukuba (Japan)
Y2 1 Nov 2021 - 4 Nov 2021
M2 Tsukuba, Japan
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/905505