TY  - CONF
AU  - Menzel, Stephan
TI  - Reliability Modeling of Memristive Devices based on the Valence Change Mechanism
M1  - FZJ-2022-00746
PY  - 2021
T2  - Memrisys 2021
CY  - 1 Nov 2021 - 4 Nov 2021, Tsukuba (Japan)
Y2  - 1 Nov 2021 - 4 Nov 2021
M2  - Tsukuba, Japan
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/905505
ER  -