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@ARTICLE{Andrade:906949,
author = {Andrade, Jaime M. M. and Rosário, Carlos M. M. and Menzel,
Stephan and Waser, Rainer and Sobolev, Nikolai A.},
title = {{A}pplication of the {Q}uantum-{P}oint-{C}ontact
{F}ormalism to {M}odel the {F}ilamentary {C}onduction in
{T}a 2 {O} 5 -{B}ased {R}esistive {S}witching {D}evices},
journal = {Physical review applied},
volume = {17},
number = {3},
issn = {2331-7019},
address = {College Park, Md. [u.a.]},
publisher = {American Physical Society},
reportid = {FZJ-2022-01767},
pages = {034062},
year = {2022},
abstract = {Redox-based resistive random access memories (ReRAMs) are
promising candidate devices for new memory and computing
paradigms. However, the fundamental mechanisms that rule the
conduction in these devices are still heavily debated. The
present work focuses on studying one model for the
conduction, the quantum point contact (QPC), and
specifically a single-subband approximation (SSA) to this
model. With this intent, Pt(20 nm)/Ta(15 nm)Ta2O5(5
nm)/Pt(20 nm) resistive switching devices are fabricated and
electrically characterized by measuring current-voltage
(I-V) curves in both resistance states. The QPC model has
been found to be hard to apply, as the starting parameters
have a strong influence on the fitting results. On the other
hand, the SSA has proved its ability to provide good fits to
the data and to do so better than other typical conduction
mechanisms considered. However, its physical basis is
criticized and it is concluded that in the devices studied,
multiple subbands likely contribute to the conduction, in
direct opposition to the assumptions made in such an
approximation. A reinterpretation of the parameters of the
SSA is proposed, to reconcile the increased performance with
greater physical accuracy. Beyond that, the main challenges
and difficulties regarding the application of the QPC to the
case of valence-change-based ReRAM are discussed.},
cin = {PGI-7 / JARA-FIT / PGI-10},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$ /
I:(DE-Juel1)PGI-10-20170113},
pnm = {5233 - Memristive Materials and Devices (POF4-523)},
pid = {G:(DE-HGF)POF4-5233},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000783556500001},
doi = {10.1103/PhysRevApplied.17.034062},
url = {https://juser.fz-juelich.de/record/906949},
}