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@ARTICLE{Ravishankar:907299,
      author       = {Ravishankar, Sandheep and Liu, Zhifa and Rau, Uwe and
                      Kirchartz, Thomas},
      title        = {{M}ultilayer {C}apacitances: {H}ow {S}elective {C}ontacts
                      {A}ffect {C}apacitance {M}easurements of {P}erovskite
                      {S}olar {C}ells},
      journal      = {PRX energy},
      volume       = {1},
      number       = {1},
      address      = {College Park, MD},
      publisher    = {American Physical Society},
      reportid     = {FZJ-2022-01950},
      pages        = {013003},
      year         = {2022},
      abstract     = {Capacitance measurements as a function of voltage,
                      frequency, and temperature are a useful tool to gain a
                      deeper insight into the electronic properties of
                      semiconductor devices in general and of solar cells in
                      particular. Techniques such as capacitance-voltage,
                      Mott-Schottky analysis, or thermal-admittance spectroscopy
                      measurements are frequently employed in perovskite solar
                      cells to obtain relevant parameters of the perovskite
                      absorber. However, state-of-the-art perovskite solar cells
                      use thin electron- and hole-transport layers to improve the
                      contact selectivity. These contacts are often quite
                      resistive in nature, which implies that their resistance
                      will significantly contribute to the total device impedance
                      and thereby also affect the overall capacitance of the
                      device, thus partly obscuring the capacitance signal from
                      the perovskite absorber. Based on this premise, we develop a
                      simple multilayer model that considers the perovskite solar
                      cell as a series connection of the geometric capacitance of
                      each layer in parallel with their voltage-dependent
                      resistances. Analysis of this model yields fundamental
                      limits to the resolution of spatial doping profiles and
                      minimum values of doping and trap densities, built-in
                      voltages, and activation energies. We observe that most of
                      the experimental capacitance-voltage-frequency-temperature
                      data, calculated doping and defect densities, and activation
                      energies reported in the literature are within the derived
                      cutoff values, indicating that the capacitance response of
                      the perovskite solar cell is indeed strongly affected by the
                      capacitance of its selective contacts.},
      cin          = {IEK-5},
      ddc          = {530},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {1215 - Simulations, Theory, Optics, and Analytics (STOA)
                      (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1215},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1103/PRXEnergy.1.013003},
      url          = {https://juser.fz-juelich.de/record/907299},
}