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@ARTICLE{Bengel:908364,
author = {Bengel, Christopher and Mohr, Johannes and Wiefels, Stefan
and Singh, Abhairaj and Gebregiorgis, Anteneh and Bishnoi,
Rajendra and Hamdioui, Said and Waser, Rainer and Wouters,
Dirk and Menzel, Stephan},
title = {{R}eliability aspects of binary
vector-matrix-multiplications using {R}e{RAM} devices},
journal = {Neuromorphic computing and engineering},
volume = {2},
number = {3},
issn = {2634-4386},
address = {Bristol},
publisher = {IOP Publishing Ltd.},
reportid = {FZJ-2022-02566},
pages = {034001 -},
year = {2022},
abstract = {Computation-in-memory using memristive devices is a
promising approach to overcome the performance limitations
of conventional computing architectures introduced by the
von Neumann bottleneck which are also known as memory wall
and power wall. It has been shown that accelerators based on
memristive devices can deliver higher energy efficiencies
and data throughputs when compared with conventional
architectures. In the vast multitude of memristive devices,
bipolar resistive switches based on the valence change
mechanism (VCM) are particularly interesting due to their
low power operation, non-volatility, high integration
density and their CMOS compatibility. While a wide range of
possible applications is considered, many of them such as
artificial neural networks heavily rely on
vector-matrix-multiplications (VMMs) as a mathematical
operation. These VMMs are made up of large numbers of
multiplication and accumulation (MAC) operations. The MAC
operation can be realised using memristive devices in an
analog fashion using Ohm's law and Kirchhoff's law. However,
VCM devices exhibit a range of non-idealities, affecting the
VMM performance, which in turn impacts the overall accuracy
of the application. Those non-idealities can be classified
into time-independent (programming variability) and
time-dependent (read disturb and read noise). Additionally,
peripheral circuits such as analog to digital converters can
introduce errors during the digitalization. In this work, we
experimentally and theoretically investigate the impact of
device- and circuit-level effects on the VMM in a VCM
crossbars. Our analysis shows that the variability of the
low resistive state plays a key role and that reading in the
RESET direction should be favored to reading in the SET
direction.},
cin = {PGI-7 / PGI-10 / JARA-FIT},
ddc = {621.3},
cid = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-10-20170113 /
$I:(DE-82)080009_20140620$},
pnm = {5233 - Memristive Materials and Devices (POF4-523) /
BMBF-16ME0398K - Verbundprojekt: Neuro-inspirierte
Technologien der künstlichen Intelligenz für die
Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) /
BMBF-16ME0399 - Verbundprojekt: Neuro-inspirierte
Technologien der künstlichen Intelligenz für die
Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0399) /
MNEMOSENE - Computation-in-memory architecture based on
resistive devices (780215)},
pid = {G:(DE-HGF)POF4-5233 / G:(DE-82)BMBF-16ME0398K /
G:(DE-82)BMBF-16ME0399 / G:(EU-Grant)780215},
typ = {PUB:(DE-HGF)16},
UT = {WOS:001064078600001},
doi = {10.1088/2634-4386/ac6d04},
url = {https://juser.fz-juelich.de/record/908364},
}