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@ARTICLE{Dittmann:909102,
author = {Dittmann, Regina and Menzel, Stephan and Waser, Rainer},
title = {{N}anoionic memristive phenomena in metal oxides: the
valence change mechanism},
journal = {Advances in physics},
volume = {70},
number = {2},
issn = {0001-8732},
address = {London},
publisher = {Taylor $\&$ Francis},
reportid = {FZJ-2022-03012},
pages = {155-349},
year = {2022},
abstract = {This review addresses resistive switching devices operating
according to the bipolar valence change mechanism (VCM),
which has become a major trend in electronic materials and
devices over the last decade due to its high potential for
non-volatile memories and future neuromorphic computing. We
will provide detailed insights into the status of
understanding of these devices as a fundament for their use
in the different fields of application. The review covers
the microscopic physics of memristive states and the
switching kinetics of VCM devices. It is shown that the
switching of all variants of VCM cells relies on the
movement of mobile donor ions, which are typically oxygen
vacancies or cation interstitials. VCM cells consist of
three parts: an electronically active electrode (AE), often
a metal with a high work function, in front of which the
switching occurs, a mixed ionic-electronic conducting (MIEC)
layer consisting of a nanometer-scale metal oxide or a stack
of different metal oxides, and an ohmic counter electrode
(OE). After an introduction to definitions and
classification, the fundamentals of solid-state physics and
chemistry associated with VCM cells are described, including
redox processes and the role of electrodes. The microscopic
changes induced by electroforming, a process often required
prior to resistive switching, are described in terms of
electronic initialization and subsequent changes in
chemistry, structure, and conductivity. The switching
process is discussed in terms of switching polarity,
geometry of the switching region, and spectroscopic
detection of the valence changes. Emphasis is placed on the
extreme nonlinearity of switching kinetics described by
physics-based multiscale modeling, ranging from ab initio
methods to kinetic Monte Carlo and finite element models to
compact models that can be used in circuit simulators. The
review concludes with a treatment of the highly relevant
reliability issues and a description of the failure
mechanisms, including mutual trade-offs.},
cin = {PGI-7 / PGI-10 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-10-20170113 /
$I:(DE-82)080009_20140620$},
pnm = {5233 - Memristive Materials and Devices (POF4-523) / BMBF
16ES1133K - Verbundprojekt: Neuro-inspirierte Technologien
der künstlichen Intelligenz für die Elektronik der Zukunft
- NEUROTEC -, Teilvorhaben: Forschungszentrum Jülich
(16ES1133K)},
pid = {G:(DE-HGF)POF4-5233 / G:(BMBF)16ES1133K},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000836976000001},
doi = {10.1080/00018732.2022.2084006},
url = {https://juser.fz-juelich.de/record/909102},
}