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@ARTICLE{Laird:909558,
      author       = {Laird, Jamie S. and Ravishankar, Sandheep and Rietwyk,
                      Kevin J. and Mao, Wenxin and Bach, Udo and Smith, Trevor A.},
      title        = {{I}ntensity {M}odulated {P}hotocurrent {M}icrospectrosopy
                      for {N}ext {G}eneration {P}hotovoltaics},
      journal      = {Small methods},
      volume       = {6},
      number       = {9},
      issn         = {2366-9608},
      address      = {Weinheim},
      publisher    = {WILEY-VCH Verlag GmbH $\&$ Co. KGaA},
      reportid     = {FZJ-2022-03247},
      pages        = {2200493},
      year         = {2022},
      abstract     = {In this report, a large-area laser beam induced current
                      microscope that has been adapted to perform intensity
                      modulated photocurrent spectroscopy (IMPS) in an imaging
                      mode is described. Microscopy-based IMPS method provides a
                      spatial resolution of the frequency domain response of the
                      solar cell, allowing correlation of the optoelectronic
                      response with a particular interface, bulk material,
                      specific transport layer, or transport parameter. The system
                      is applied to study degradation effects in back-contact
                      perovskite cells where it is found to readily differentiate
                      areas based on their markedly different frequency response.
                      Using the diffusion-recombination model, the IMPS response
                      is modeled for a sandwich structure and extended for the
                      special case of lateral diffusion in a back-contact cell. In
                      the low-frequency limit, the model is used to calculate
                      spatial maps of the carrier ambipolar diffusion length. The
                      observed frequency response of IMPS images is then
                      discussed.},
      cin          = {IEK-5},
      ddc          = {620},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {1215 - Simulations, Theory, Optics, and Analytics (STOA)
                      (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1215},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {35973943},
      UT           = {WOS:000840898300001},
      doi          = {10.1002/smtd.202200493},
      url          = {https://juser.fz-juelich.de/record/909558},
}