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@ARTICLE{Artanov:909782,
      author       = {Artanov, Anton A. and Gutierrez-D, Edmundo A. and Cabrera
                      Galicia, Alfonso Rafael and Kruth, Andre and Degenhardt,
                      Carsten and Durini, Daniel and Mendez-V, Jairo and Van
                      Waasen, Stefan},
      title        = {{S}elf-{H}eating {E}ffect in a 65 nm {MOSFET} at
                      {C}ryogenic {T}emperatures},
      journal      = {IEEE transactions on electron devices},
      volume       = {69},
      number       = {3},
      issn         = {0018-9383},
      address      = {New York, NY},
      publisher    = {IEEE},
      reportid     = {FZJ-2022-03412},
      pages        = {900 - 904},
      year         = {2022},
      abstract     = {We characterized the thermal behavior of a 65 nm bulk CMOS
                      transistor, by measuring the self-heating effect (SHE) as a
                      function of bias condition. We demonstrated that at a base
                      temperature of 6.5 K the channel temperature of the
                      transistor can increase up to several tens of kelvins due to
                      power dissipation. The thermal behavior of the transistor is
                      determined not only by the thermal response of the
                      transistor itself but also by the thermal properties of the
                      surroundings, i.e., source, drain, bulk, and gate
                      interfaces, metal contacts, and vias. On top of it, the
                      thermal response is bias-dependent through bias dependence
                      of power and self-heating. This information becomes relevant
                      for proper design of integrated circuits for quantum
                      computing or other cryogenic applications, where the
                      circuitry requires to be operated at a stable cryogenic
                      temperature.},
      cin          = {ZEA-2},
      ddc          = {620},
      cid          = {I:(DE-Juel1)ZEA-2-20090406},
      pnm          = {5223 - Quantum-Computer Control Systems and Cryoelectronics
                      (POF4-522)},
      pid          = {G:(DE-HGF)POF4-5223},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000742676600001},
      doi          = {10.1109/TED.2021.3139563},
      url          = {https://juser.fz-juelich.de/record/909782},
}