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@ARTICLE{Gutsche:909835,
author = {Gutsche, Alexander and Hambsch, Sebastian and Branca, Nuno
Casa and Dittmann, Regina and Scholz, Stefan and Knoch,
Joachim},
title = {{D}isentangling ionic and electronic contributions to the
switching dynamics of memristive {P}r 0.7 {C}a 0.3 {M}n{O} 3
/ {A}l devices by employing a two-resistor model},
journal = {Physical review materials},
volume = {6},
number = {9},
issn = {2475-9953},
address = {College Park, MD},
publisher = {APS},
reportid = {FZJ-2022-03453},
pages = {095002},
year = {2022},
abstract = {Area-dependent memristive devices such as Al/Pr0.7Ca0.3MnO3
(PCMO) stacks are highly interesting candidates for synapses
in neuromorphic circuits due to their gradual switching
properties, their reduced variability and the possibility to
tune the resistance with the device area. However, due to
the complexity of the different processes taking place, the
electronic and ionic transport in theses devices is so far
only poorly understood and physical compact models to
simulate their behavior are missing so far. We developed a
mathematical description of the dynamics of theses devices
based on a simple two-resistor model that reproduces the
device behavior very well. Based on x-ray photoelectron
spectroscopy and impedance spectroscopy we assign the two
resistors to the AlOx layer and a depletion zone at the
Pr0.7Ca0.3MnO3 layer, respectively. We assign the parameters
used within the mathematical model to physical parameters
and make use of them in order to explain the dynamics of the
switching processes during the SET and RESET process in
different voltage regimes. For both poly- and single
crystalline PCMO thin film devices, oxygen migration between
the AlOx and the PCMO depletion zone is responsible for the
resistance change. However, the dynamics differ
significantly due to the increased mobility of oxygen
vacancies with increasing defect density in the case of the
polycrystalline samples. Moreover, we observe volatile
subloops in our current-voltage curves, which vanish within
millisecond time scale. Based on our two-resistor model and
the band diagram derived from spectroscopic measurements, we
assign these subloops to the injection of electrons into
traps within the AlOx barrier.},
cin = {PGI-7 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
pnm = {5233 - Memristive Materials and Devices (POF4-523) /
BMBF-16ME0399 - Verbundprojekt: Neuro-inspirierte
Technologien der künstlichen Intelligenz für die
Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0399) /
BMBF-16ME0398K - Verbundprojekt: Neuro-inspirierte
Technologien der künstlichen Intelligenz für die
Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) /
Advanced Computing Architectures $(aca_20190115)$ /
BMBF-03ZU1106AB - NeuroSys: "Memristor Crossbar
Architekturen (Projekt A) - B" (BMBF-03ZU1106AB)},
pid = {G:(DE-HGF)POF4-5233 / G:(DE-82)BMBF-16ME0399 /
G:(DE-82)BMBF-16ME0398K / $G:(DE-Juel1)aca_20190115$ /
G:(DE-Juel1)BMBF-03ZU1106AB},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000874905300002},
doi = {10.1103/PhysRevMaterials.6.095002},
url = {https://juser.fz-juelich.de/record/909835},
}