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@INPROCEEDINGS{Junk:910087,
author = {Junk, Yannik and Frauenrath, Marvin and Han, Yi and
Concepción Díaz, Omar and Bae, Jin Hee and Hartmann,
Jean-Michel and Grützmacher, Detlev and Buca, Dan Mihai and
Zhao, Qing-Tai},
title = {{G}e{S}n {V}ertical {G}ate-all-around {N}anowire n-type
{MOSFET}s},
reportid = {FZJ-2022-03606},
pages = {364-367},
year = {2022},
abstract = {Vertical GeSn gate-all-around (GAA) nanowire nMOSFETs
fabricated using a top-down approach are presented. The
devices are benchmarked with similar Ge and Ge/GeSn/Ge
heterostructure devices to underline the great potential of
GeSn for future nMOS devices. Device measurements are
performed in the temperature range from 12 K to room
temperature (RT, 300 K). At RT the all-GeSn n-MOSFETs show a
subthreshold swing (SS) of ~120 mV/dec that decreases at
cryogenic temperatures to a very steep 20mV/dec. The abrupt
transition from subthreshold to on-state shows the
suitability of GeSn alloys for cryogenic CMOS applications.},
month = {Sep},
date = {2022-09-19},
organization = {IEEE 52nd European Solid State Device
Research Conference, Milan (Italy), 19
Sep 2022 - 22 Sep 2022},
cin = {PGI-9},
cid = {I:(DE-Juel1)PGI-9-20110106},
pnm = {5234 - Emerging NC Architectures (POF4-523)},
pid = {G:(DE-HGF)POF4-5234},
typ = {PUB:(DE-HGF)8},
url = {https://juser.fz-juelich.de/record/910087},
}