% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Urban:910248,
      author       = {Urban, Knut W. and Barthel, Juri and Houben, Lothar and
                      Jia, Chun-Lin and Jin, Lei and Lentzen, Markus and Mi,
                      Shao-Bo and Thust, Andreas and Tillmann, Karsten},
      title        = {{P}rogress in atomic-resolution aberration corrected
                      conventional transmission electron microscopy ({CTEM})},
      journal      = {Progress in materials science},
      volume       = {133},
      issn         = {0048-5500},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2022-03709},
      pages        = {101037 -},
      year         = {2023},
      abstract     = {Transmission electron microscopy is an indispensable tool
                      in modern materials science. It enables the structure of
                      materials to be studied with high spatial resolution, and
                      thus makes a decisive contribution to the fact that it is
                      now possible to understand the microstructure-related
                      physical and chemical characteristics and to correlate these
                      with the macroscopic materials properties. It was tantamount
                      to a paradigm shift when electron microscopy reached atomic
                      resolution in the late 1990s due to the invention of
                      aberration-corrected electron optics. It is now generally
                      accepted practice to perform picometer-scale measurements
                      and chemical analyses with reference to single atomic units.
                      This review has three objectives. Microscopy in atomic
                      dimensions is applied quantum physics. The consequences of
                      this for practical work and for the understanding and
                      application of the results shall be worked out. Typical
                      applications in materials science will be used to show what
                      can be done with this kind of microscopy and where its
                      limitations lie. In the absence of relevant monographs, the
                      aim is to provide an introduction to this new type of
                      electron microscopy and to enable the reader to access the
                      literature in which special issues are addressed. The paper
                      begins with a brief presentation of the principles of
                      optical aberration correction. It then discusses the
                      fundamentals of atomic imaging and covers typical examples
                      of practical applications to problems in modern materials
                      science. It is emphasized that in atomic-resolution electron
                      microscopy the quantitative interpretation of the images
                      must always be based on the solution of the quantum physical
                      and optical problem on a computer.},
      cin          = {ER-C-1 / ER-C-2},
      ddc          = {530},
      cid          = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)ER-C-2-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / 5353 - Understanding the
                      Structural and Functional Behavior of Solid State Systems
                      (POF4-535)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)POF4-5353},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000910083800001},
      doi          = {10.1016/j.pmatsci.2022.101037},
      url          = {https://juser.fz-juelich.de/record/910248},
}