%0 Journal Article
%A Ascoli, Alon
%A Menzel, Stephan
%A Rana, Vikas
%A Kempen, Tim
%A Messaris, Ioannis
%A Demirkol, Ahmet Samil
%A Schulten, Michael
%A Siemon, Anne
%A Tetzlaff, Ronald
%T A Deep Study of Resistance Switching Phenomena in TaO x ReRAM Cells: System‐Theoretic Dynamic Route Map Analysis and Experimental Verification
%J Advanced electronic materials
%V 8
%N 8
%@ 2199-160X
%C Weinheim
%I Wiley-VCH Verlag GmbH & Co. KG
%M FZJ-2022-03960
%P 2200182 -
%D 2022
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000838650600001
%R 10.1002/aelm.202200182
%U https://juser.fz-juelich.de/record/910582