TY  - JOUR
AU  - Ascoli, Alon
AU  - Menzel, Stephan
AU  - Rana, Vikas
AU  - Kempen, Tim
AU  - Messaris, Ioannis
AU  - Demirkol, Ahmet Samil
AU  - Schulten, Michael
AU  - Siemon, Anne
AU  - Tetzlaff, Ronald
TI  - A Deep Study of Resistance Switching Phenomena in TaO x ReRAM Cells: System‐Theoretic Dynamic Route Map Analysis and Experimental Verification
JO  - Advanced electronic materials
VL  - 8
IS  - 8
SN  - 2199-160X
CY  - Weinheim
PB  - Wiley-VCH Verlag GmbH & Co. KG
M1  - FZJ-2022-03960
SP  - 2200182 -
PY  - 2022
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000838650600001
DO  - DOI:10.1002/aelm.202200182
UR  - https://juser.fz-juelich.de/record/910582
ER  -