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100 1 _ |a Schnieders, K.
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245 _ _ |a Effect of electron conduction on the read noise characteristics in ReRAM devices
260 _ _ |a Melville, NY
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856 4 _ |u https://juser.fz-juelich.de/record/910720/files/Invoice_APM22-AR-00535_01034.pdf
856 4 _ |u https://juser.fz-juelich.de/record/910720/files/Effect%20of%20electron%20conduction%20on%20the%20read%20noise%20characteristics%20in%20ReRAM%20devices.pdf
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