%0 Journal Article
%A Peric, Nemanja
%A Durand, Corentin
%A Berthe, Maxime
%A Lu, Yan
%A N'Konou, Kekeli
%A Coratger, Roland
%A Lefebvre, Isabelle
%A Ebert, Philipp
%A Biadala, Louis
%A Desplanque, Ludovic
%A Wallart, Xavier
%A Grandidier, B.
%T Direct measurement of band offsets on selective area grown In 0.53 Ga 0.47 As/InP heterojunction with multiple probe scanning tunneling microscopy
%J Applied physics letters
%V 121
%N 19
%@ 0003-6951
%C Melville, NY
%I American Inst. of Physics
%M FZJ-2022-04436
%P 192104 -
%D 2022
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000880805900005
%R 10.1063/5.0104807
%U https://juser.fz-juelich.de/record/911110