Home > Publications database > Direct measurement of band offsets on selective area grown In 0.53 Ga 0.47 As/InP heterojunction with multiple probe scanning tunneling microscopy > print

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100 1 _ |a Peric, Nemanja
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245 _ _ |a Direct measurement of band offsets on selective area grown In 0.53 Ga 0.47 As/InP heterojunction with multiple probe scanning tunneling microscopy
260 _ _ |a Melville, NY
|c 2022
|b American Inst. of Physics
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700 1 _ |a Durand, Corentin
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700 1 _ |a Berthe, Maxime
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700 1 _ |a Lu, Yan
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700 1 _ |a N'Konou, Kekeli
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700 1 _ |a Coratger, Roland
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700 1 _ |a Lefebvre, Isabelle
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700 1 _ |a Ebert, Philipp
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700 1 _ |a Biadala, Louis
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700 1 _ |a Desplanque, Ludovic
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700 1 _ |a Wallart, Xavier
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700 1 _ |a Grandidier, B.
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773 _ _ |a 10.1063/5.0104807
|g Vol. 121, no. 19, p. 192104 -
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|t Applied physics letters
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|y 2022
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856 4 _ |y Published on 2022-11-07. Available in OpenAccess from 2023-11-07.
|u https://juser.fz-juelich.de/record/911110/files/5.0104807.pdf
856 4 _ |y Published on 2022-11-07. Available in OpenAccess from 2023-11-07.
|u https://juser.fz-juelich.de/record/911110/files/Direct%20measurement_APL22-AR-05091.pdf
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