%0 Journal Article
%A Kopperberg, Nils
%A Wiefels, Stefan
%A Hofmann, Karl
%A Otterstedt, Jan
%A Wouters, Dirk J.
%A Waser, Rainer
%A Menzel, Stephan
%T Endurance of 2 Mbit Based BEOL Integrated ReRAM
%J IEEE access
%V 10
%@ 2169-3536
%C New York, NY
%I IEEE
%M FZJ-2022-05324
%P 122696 - 122705
%D 2022
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000892894900001
%R 10.1109/ACCESS.2022.3223657
%U https://juser.fz-juelich.de/record/912099