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@ARTICLE{Florczak:916566,
      author       = {Florczak, Josua and Neubert, Tom and Zimmermann, Egon and
                      Rongen, Heinz and Kaufmann, Martin and Riese, Martin and van
                      Waasen, Stefan and Rienäcker, Ingo and Hajdas, Wojciech},
      title        = {{C}alibration of the deposited energy in {CMOS} imagers for
                      particle detection on nanosatellite},
      journal      = {IEEE transactions on nuclear science},
      volume       = {70},
      number       = {8},
      issn         = {0018-9499},
      address      = {New York, NY},
      publisher    = {IEEE},
      reportid     = {FZJ-2022-06342},
      pages        = {1966 - 1972},
      year         = {2023},
      note         = {Post-Print hinzugefügt},
      abstract     = {Commercial off-the-shelf (COTS) CMOS sensors are
                      increasingly used in scientific applications on
                      nanosatellites. Applying a software-based approach and in
                      addition to their image acquisitions tasks, these CMOS
                      sensors can be used to detect ionizing particles to improve
                      the fault tolerance of imaging instruments on nanosatellites
                      without the need for additional hardware. A challenge in
                      using COTS components for this approach is that essential
                      radiation test data and important parameters such as the
                      thickness of the sensitive epitaxial layer are typically not
                      available. With a simplified calibration approach, we
                      determine the epitaxial layer thickness and calibrate the
                      deposited energy sensitivity with minimal measurement time
                      and steps and minor requirements on the test facility. A
                      forward model for particle track length determination with
                      an increased angle scattering of incident protons is used to
                      handle stronger parameter uncertainties of the test setup.
                      It is shown that the currently used CMOS sensor (HWK1910A)
                      is a suitable candidate for a radiation monitor, based on
                      the determined epitaxial layer thickness and the deposited
                      energy calibration factor, in combination with the in-orbit
                      mission data. This enables capabilities for more individual
                      protection measures in case of unexpected radiation
                      environments.},
      cin          = {IEK-7 / ZEA-2},
      ddc          = {620},
      cid          = {I:(DE-Juel1)IEK-7-20101013 / I:(DE-Juel1)ZEA-2-20090406},
      pnm          = {2112 - Climate Feedbacks (POF4-211) / RADNEXT - RADiation
                      facility Network for the EXploration of effects for indusTry
                      and research (101008126)},
      pid          = {G:(DE-HGF)POF4-2112 / G:(EU-Grant)101008126},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001116676600059},
      doi          = {10.1109/TNS.2023.3274876},
      url          = {https://juser.fz-juelich.de/record/916566},
}