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@ARTICLE{Lbke:917491,
author = {Lübke, Dana and Hartnagel, Paula and Hülsbeck, Markus and
Kirchartz, Thomas},
title = {{U}nderstanding the {T}hickness and {L}ight-{I}ntensity
{D}ependent {P}erformance of {G}reen-{S}olvent {P}rocessed
{O}rganic {S}olar {C}ells},
journal = {ACS materials Au},
volume = {3},
number = {3},
issn = {2694-2461},
address = {Washington, DC},
publisher = {ACS Publications},
reportid = {FZJ-2023-00704},
pages = {215-230},
year = {2023},
abstract = {For indoor light harvesting, the adjustable band gap of
molecular semiconductors is a significant advantage relative
to many inorganic photovoltaic technologies. However,
several challenges have to be overcome that include
processability in nonhalogenated solvents, sufficiently high
thicknesses (>250 nm) and high efficiencies at illuminances
typically found in indoor environments. Here, we report on
the development and application of new methods to quantify
and identify performance losses based on thickness- and
intensity-dependent current density–voltage measurements.
Furthermore, we report on the fabrication of solar cells
based on the blend PBDB-T:F-M processed in the
nonhalogenated solvent o-xylene. In the low-intensity
regime, insufficiently high shunt resistances limit the
photovoltaic performance and by analyzing current density
voltage–curves for solar cells with various shunt
resistances we find that ∼100 kΩ cm2 are required at 200
lux. We provide a unified description of fill factor losses
introducing the concept of light-intensity-dependent
apparent shunts that originate from incomplete and
voltage-dependent charge collection. In experiment and
simulation, we show that good fill factors are associated
with a photo-shunt inversely scaling with intensity.
Intensity regions with photo-shunt resistances close to the
dark-shunt resistance are accompanied by severe extraction
losses. To better analyze recombination, we perform a
careful analysis of the light intensity and thickness
dependence of the open-circuit voltage and prove that
trap-assisted recombination dominates the recombination
losses at low light intensities.},
cin = {IEK-5},
ddc = {540},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {1212 - Materials and Interfaces (POF4-121) / 1215 -
Simulations, Theory, Optics, and Analytics (STOA)
(POF4-121)},
pid = {G:(DE-HGF)POF4-1212 / G:(DE-HGF)POF4-1215},
typ = {PUB:(DE-HGF)16},
UT = {WOS:001011308100001},
doi = {10.1021/acsmaterialsau.2c00070},
url = {https://juser.fz-juelich.de/record/917491},
}