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@INPROCEEDINGS{Schmidt:917495,
      author       = {Schmidt, Niclas and Karthäuser, Silvia and Kaiser, N. and
                      Vogel, T. and Piros, E. and Alff, L. and Waser, R. and
                      Dittmann, Regina},
      title        = {{S}patially resolved electrical analysis of epitaxial
                      defect-stabilized hafnium oxide thin films},
      reportid     = {FZJ-2023-00708},
      year         = {2022},
      month         = {Nov},
      date          = {2022-11-27},
      organization  = {Materials Research Society Fall
                       Meeting, Boston (USA), 27 Nov 2022 - 2
                       Dec 2022},
      subtyp        = {Other},
      cin          = {PGI-7 / JARA-FIT / PGI-10},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$ /
                      I:(DE-Juel1)PGI-10-20170113},
      pnm          = {5233 - Memristive Materials and Devices (POF4-523)},
      pid          = {G:(DE-HGF)POF4-5233},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/917495},
}