| Hauptseite > Publikationsdatenbank > Spatially resolved electrical analysis of epitaxial defect-stabilized hafnium oxide thin films > print |
| 001 | 917495 | ||
| 005 | 20230123101930.0 | ||
| 037 | _ | _ | |a FZJ-2023-00708 |
| 100 | 1 | _ | |a Schmidt, Niclas |0 P:(DE-Juel1)179230 |b 0 |u fzj |
| 111 | 2 | _ | |a Materials Research Society Fall Meeting |c Boston |d 2022-11-27 - 2022-12-02 |w USA |
| 245 | _ | _ | |a Spatially resolved electrical analysis of epitaxial defect-stabilized hafnium oxide thin films |
| 260 | _ | _ | |c 2022 |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a Other |2 DataCite |
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| 536 | _ | _ | |a 5233 - Memristive Materials and Devices (POF4-523) |0 G:(DE-HGF)POF4-5233 |c POF4-523 |f POF IV |x 0 |
| 700 | 1 | _ | |a Karthäuser, Silvia |0 P:(DE-Juel1)130751 |b 1 |u fzj |
| 700 | 1 | _ | |a Kaiser, N. |0 P:(DE-HGF)0 |b 2 |
| 700 | 1 | _ | |a Vogel, T. |0 P:(DE-HGF)0 |b 3 |
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| 700 | 1 | _ | |a Dittmann, Regina |0 P:(DE-Juel1)130620 |b 7 |u fzj |
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| 914 | 1 | _ | |y 2022 |
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