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@INPROCEEDINGS{Feste:9330,
      author       = {Feste, S. F. and Knoch, J. and Buca, D. and Zhao, Q. T. and
                      Schäpers, T. and Mantl, S.},
      title        = {{E}ffective mass and {I}-{V} characterization of biaxially
                      tensile strained {SOI} {MOSFET}s},
      reportid     = {PreJuSER-9330},
      year         = {2010},
      note         = {Record converted from VDB: 12.11.2012},
      comment      = {Proceeding of 11th International Conference on Ultimate
                      Integration of Silicon ULIS 2010. S. 1 - 4},
      booktitle     = {Proceeding of 11th International
                       Conference on Ultimate Integration of
                       Silicon ULIS 2010. S. 1 - 4},
      cin          = {IBN-1 / JARA-FIT},
      cid          = {I:(DE-Juel1)VDB799 / $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      typ          = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
      url          = {https://juser.fz-juelich.de/record/9330},
}