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@ARTICLE{Zheng:972120,
author = {Zheng, Fengshan and Migunov, Vadim and Caron, Jan and Du,
Hongchu and Pozzi, Giulio and Dunin-Borkowski, Rafal E.},
title = {{N}anoscale {T}hree-{D}imensional {C}harge {D}ensity and
{E}lectric {F}ield {M}apping by {E}lectron {H}olographic
{T}omography},
journal = {Nano letters},
volume = {23},
number = {3},
issn = {1530-6984},
address = {Washington, DC},
publisher = {ACS Publ.},
reportid = {FZJ-2023-01082},
pages = {843-849},
year = {2023},
abstract = {The operation of nanoscale electronic devices is related
intimately to the three-dimensional (3D) charge density
distributions within them. Here, we demonstrate the
quantitative 3D mapping of the charge density and long-range
electric field associated with an electrically biased carbon
fiber nanotip with a spatial resolution of approximately 5
nm using electron holographic tomography in the transmission
electron microscope combined with model-based iterative
reconstruction. The approach presented here can be applied
to a wide range of other nanoscale materials and devices.},
cin = {ER-C-1},
ddc = {660},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {5351 - Platform for Correlative, In Situ and Operando
Characterization (POF4-535) / SIMDALEE2 - Sources,
Interaction with Matter, Detection and Analysis ofLow Energy
Electrons 2 (606988) / DFG project 167917811 - SFB 917:
Resistiv schaltende Chalkogenide für zukünftige
Elektronikanwendungen: Struktur, Kinetik und
Bauelementskalierung "Nanoswitches" (167917811) / Q-SORT -
QUANTUM SORTER (766970) / ESTEEM3 - Enabling Science and
Technology through European Electron Microscopy (823717)},
pid = {G:(DE-HGF)POF4-5351 / G:(EU-Grant)606988 /
G:(GEPRIS)167917811 / G:(EU-Grant)766970 /
G:(EU-Grant)823717},
typ = {PUB:(DE-HGF)16},
pubmed = {36689622},
UT = {WOS:000924397400001},
doi = {10.1021/acs.nanolett.2c03879},
url = {https://juser.fz-juelich.de/record/972120},
}