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@ARTICLE{Oberaigner:996766,
      author       = {Oberaigner, Michael and Clausen, Alexander and Weber,
                      Dieter and Kothleitner, Gerald and Dunin-Borkowski, Rafal E
                      and Knez, Daniel},
      title        = {{O}nline {T}hickness {D}etermination with {P}osition
                      {A}veraged {C}onvergent {B}eam {E}lectron {D}iffraction
                      using {C}onvolutional {N}eural {N}etworks},
      journal      = {Microscopy and microanalysis},
      volume       = {29},
      number       = {1},
      issn         = {1079-8501},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2023-01175},
      pages        = {427 - 436},
      year         = {2023},
      cin          = {ER-C-1},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / ESTEEM3 - Enabling Science and
                      Technology through European Electron Microscopy (823717)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(EU-Grant)823717},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001033590800041},
      doi          = {10.1093/micmic/ozac050},
      url          = {https://juser.fz-juelich.de/record/996766},
}