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| Home > Publications database > Probing the Nanoworld: Microscopies, Scattering and Spectroscopies of the Solid State This spring school was organized by the Institute of Solid State Research of Research Centre Jülich on 12 – 23 March 2007. |
| Home > Publications database > Probing the Nanoworld: Microscopies, Scattering and Spectroscopies of the Solid State This spring school was organized by the Institute of Solid State Research of Research Centre Jülich on 12 – 23 March 2007. |
| Book | FZJ-2016-04212 |
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2007
Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag
Jülich
ISBN: 978-3-89336-462-6
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Please use a persistent id in citations: doi:10.34734/FZJ-2016-04212
Abstract: The world of nanoscale objects and dimensions – which until recently had largely been a subject of merely scientific interest – is poised to revolutionise technology at a breathtaking pace and will even affect our everyday life in many respects. The development of faster and more powerful computers is based on progress in semiconductor nanotechnology, also incorporating optoelectronics. The simultaneous evolution of magnetic data storage technology is driven by progress in nanomagnetism. The exploitation of novel quantum effects in many fields is tied to the creation of nanoscale objects and structures. On the other hand, nanostructured surfaces also exhibit particular mechanical and adhesive properties, exemplified by the “lotus effect”, which is now employed to create stain-free and selfcleaning surfaces and surface coatings. It is obvious that not only the creation of nanoscale structures, but particularly their characterisation and visualisation are essential ingredients in design and development leading to the fabrication of yet smaller structures and a refined understanding of their unique properties. Real progress in nanoscience is hence closely associated with the development of new techniques in experimental analysis to address problems on the nanoscale – and, indeed, dramatic improvements in the capabilities of experimental methods involving the interaction of electrons, neutrons and synchrotron radiation with the solid state have been witnessed in recent years. This is partly due to substantial advances in the performance of beam and radiation sources as well as instrumental components such as monochromators, imaging lenses, polarisers, detectors, and spectrometers, all at roughly the same time. Equally important, however, has been the outstanding progress made in the development of new innovative analysis concepts together with the concomitant numerical methods, which allow direct benefits to be derived from advanced instrumentation. As a result, there are more and more areas of solid-state research where state-of-the-art analysis techniques, such as aberration-corrected electron microscopy, high-energy or resonant synchrotron x-ray scattering, neutron scattering with spherical polarisation analysis or with nanoelectronvolt energy resolution, as well as high-resolution electron spectroscopy and spectromicroscopy, are seen to permit macroscopic material properties to be epistemologically designed from microscopic observations. Hence, this basic approach is becoming increasingly important in identifying material imperfections and designing new materials with fascinating and also beneficial properties. All of the above probing techniques – irrespective of whether they use electrons, neutrons or synchrotron radiation – are now essential tools for exploring the nanoworld of complex materials in both bulk and reduced dimensions. Therefore, this is also the ideal time to outline when, how, and why appropriate techniques should be used for specific problems to gain deeper scientific insights into condensed matter phenomena as well as to optimise processing steps in solid-state technology. Accordingly, the 38th IFF Spring School entitled Probing the Nanoworld – Microscopies, Scattering and Spectroscopies of the Solid State organised by the Institute of Solid-State Research (IFF) of Research Centre Jülich focuses on both essential fundamentals and the latest developments in probing the solid state by the application of advanced microscopy, scattering and spectroscopy techniques. A variety of contributions address cutting-edge aspects of experimental analysis techniques in conjunction with applications related to materials science. Introductory contributions focus on the structural and electronic properties of the solid state in both bulk and reduced dimensions, and, thus form the basis for understanding primary techniques and major methodological concepts. Supplementary contributions address basic excitation mechanisms and the interaction of radiation with matter. [... ]
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