TY  - JOUR
AU  - Vaas, Timon Sebastian
AU  - Pieters, Bart Elger
AU  - Gerber, Andreas
AU  - Rau, Uwe
TI  - Thermal Stimulation of Reverse Breakdown in CIGS Solar Cells
JO  - IEEE journal of photovoltaics
VL  - 13
IS  - 3
SN  - 2156-3381
CY  - New York, NY
PB  - IEEE
M1  - FZJ-2023-01527
SP  - 1 - 6
PY  - 2023
AB  - The underlying mechanisms of the initial stages of hot-spot and therefore defect creation due to reverse breakdown in Cu(In,Ga)S e2 solar cells are not well understood. We test the thesis, that permanent damage is created due to a positive feedback loop of local temperature enhancing the local current and vice versa, resulting in a thermal runaway. We present experiments on reverse stress with simultaneously introducing local heat. Depending on the temperature profile of the introduced heat, the local current density is enhanced and leads to a gain in the local temperature. This feedback loop is shown to lead to reverse breakdown, causing permanent damage.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000936283700001
DO  - DOI:10.1109/JPHOTOV.2023.3240680
UR  - https://juser.fz-juelich.de/record/1005537
ER  -