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@ARTICLE{Landers:1008403,
      author       = {Landers, David and Clancy, Ian and Dunin-Borkowski, Rafal
                      E. and Weber, Dieter and Stewart, Andrew},
      title        = {{TEMGYM} {A}dvanced: {S}oftware for electron lens
                      aberrations and parallelised electron ray tracing},
      journal      = {Ultramicroscopy},
      volume       = {250},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2023-02329},
      pages        = {113738 -},
      year         = {2023},
      abstract     = {Characterisation of the electron beams trajectory in an
                      electron microscope is possible in a few select commercial
                      software packages, but these tools and their source code are
                      not available in a free and accessible manner. This paper
                      introduces the free and open-source software TEMGYM
                      Advanced, which implements ray tracing methods that
                      calculate the path of electrons through a magnetic or
                      electrostatic lens and allow evaluation of the first-order
                      properties and third-order geometric aberrations. Validation
                      of the aberration coefficient calculations is performed by
                      implementing two independent methods – the aberration
                      integral and differential algebra (DA) methods and by
                      comparing the results of each. This paper also demonstrates
                      parallelised electron ray tracing through a series of
                      magnetic components, which enables near real-time generation
                      of a physically accurate beam-spot including aberrations and
                      brings closer the realisation of a digital twin of an
                      electron microscope. TEMGYM Advanced represents a valuable
                      resource for the electron microscopy community, providing an
                      accessible and open source means of characterising electron
                      lenses. This software utilises the Python programming
                      language to complement the growing ecosystem of free and
                      open-source software within the electron microscopy
                      community, and to facilitate the application of machine
                      learning to an electron microscope digital twin for
                      instrument automation. The software is available under GNU
                      Public License number Three (GPL 3).},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535)},
      pid          = {G:(DE-HGF)POF4-5351},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {37080091},
      UT           = {WOS:000989407200001},
      doi          = {10.1016/j.ultramic.2023.113738},
      url          = {https://juser.fz-juelich.de/record/1008403},
}