TY  - JOUR
AU  - Aussen, Stephan
AU  - Cüppers, Felix
AU  - Funck, Carsten
AU  - Jo, Janghyun
AU  - Werner, Stephan
AU  - Pratsch, Christoph
AU  - Menzel, Stephan
AU  - Dittmann, Regina
AU  - Dunin-Borkowski, Rafal
AU  - Waser, Rainer
AU  - Hoffmann-Eifert, Susanne
TI  - Correlation between Electronic Structure, Microstructure, and Switching Mode in Valence Change Mechanism Al 2 O 3 /TiO x ‐Based Memristive Devices
JO  - Advanced electronic materials
VL  - 9
IS  - 12
SN  - 2199-160X
CY  - Weinheim
PB  - Wiley-VCH Verlag GmbH & Co. KG
M1  - FZJ-2023-03757
SP  - 2300520
PY  - 2023
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001081497300001
DO  - DOI:10.1002/aelm.202300520
UR  - https://juser.fz-juelich.de/record/1016771
ER  -