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@INPROCEEDINGS{Zheng:1025369,
author = {Zheng, Fengshan and Migunov, Vadim and Caron, Jan and Du,
Hongchu and Pozzi, Giulio and Dunin-Borkowski, Rafal E},
title = {{N}anoscale {T}hree-{D}imensional {C}harge {D}ensity and
{E}lectric {F}ield {M}apping by {E}lectron {H}olographic
{T}omography},
journal = {Microscopy and microanalysis},
volume = {29},
number = {$Supplement_1$},
issn = {1079-8501},
address = {Oxford},
publisher = {Oxford University Press},
reportid = {FZJ-2024-02832},
pages = {1392 - 1393},
year = {2023},
comment = {2023 Proceedings},
booktitle = {2023 Proceedings},
month = {Jul},
date = {2023-07-23},
organization = {Microscopy and Microanalysis,
Minneapolis, MN (USA), 23 Jul 2023 - 27
Jul 2023},
cin = {ER-C-1 / ER-C-2},
ddc = {500},
cid = {I:(DE-Juel1)ER-C-1-20170209 / I:(DE-Juel1)ER-C-2-20170209},
pnm = {5351 - Platform for Correlative, In Situ and Operando
Characterization (POF4-535) / 5353 - Understanding the
Structural and Functional Behavior of Solid State Systems
(POF4-535) / SIMDALEE2 - Sources, Interaction with Matter,
Detection and Analysis ofLow Energy Electrons 2 (606988) /
SFB 917 A06 - Resistives Schalten von amorphen,
nichtstöchiometrischen Oxidfilmen (A06) (202259141) /
Q-SORT - QUANTUM SORTER (766970) / ESTEEM3 - Enabling
Science and Technology through European Electron Microscopy
(823717)},
pid = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)POF4-5353 /
G:(EU-Grant)606988 / G:(GEPRIS)202259141 /
G:(EU-Grant)766970 / G:(EU-Grant)823717},
typ = {PUB:(DE-HGF)16 / PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
doi = {10.1093/micmic/ozad067.716},
url = {https://juser.fz-juelich.de/record/1025369},
}