Journal Article/Contribution to a conference proceedings/Contribution to a book FZJ-2024-02832

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Nanoscale Three-Dimensional Charge Density and Electric Field Mapping by Electron Holographic Tomography

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2023
Oxford University Press Oxford

2023 Proceedings
Microscopy and Microanalysis, Minneapolis, MNMinneapolis, MN, USA, 23 Jul 2023 - 27 Jul 20232023-07-232023-07-27
Microscopy and microanalysis 29(Supplement_1), 1392 - 1393 () [10.1093/micmic/ozad067.716]

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Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
  2. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
Research Program(s):
  1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
  2. 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535) (POF4-535)
  3. SIMDALEE2 - Sources, Interaction with Matter, Detection and Analysis ofLow Energy Electrons 2 (606988) (606988)
  4. SFB 917 A06 - Resistives Schalten von amorphen, nichtstöchiometrischen Oxidfilmen (A06) (202259141) (202259141)
  5. Q-SORT - QUANTUM SORTER (766970) (766970)
  6. ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717) (823717)

Appears in the scientific report 2024
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Institute Collections > ER-C > ER-C-2
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 Record created 2024-04-16, last modified 2025-02-03


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