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| Home > Publications database > Hyperspectral photoluminescence and reflectance microscopy of 2D materials |
| Home > Publications database > Hyperspectral photoluminescence and reflectance microscopy of 2D materials |
| Preprint | FZJ-2024-03163 |
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2023
arXiv
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Please use a persistent id in citations: doi:10.48550/ARXIV.2305.06945
Abstract: Optical micro-spectroscopy is an invaluable tool for studying and characterizing samples ranging from classical semiconductors to low-dimensional materials and heterostructures. To date, most implementations are based on point-scanning techniques, which are flexible and reliable, but slow. Here, we describe a setup for highly parallel acquisition of hyperspectral reflection and photoluminescence microscope images using a push-broom technique. Spatial as well as spectral distortions are characterized and their digital corrections are presented. We demonstrate close-to diffraction-limited spatial imaging performance and a spectral resolution limited by the spectrograph. The capabilities of the setup are demonstrated by recording a hyperspectral photoluminescence map of a CVD-grown MoSe$_2$-WSe$_2$ lateral heterostructure, from which we extract the luminescence energies, intensities and peak widths across the interface.
Keyword(s): Optics (physics.optics) ; Materials Science (cond-mat.mtrl-sci) ; FOS: Physical sciences
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