%0 Conference Paper
%A Wiefels, Stefan
%A Liu, Xiaohua
%A Schnieders, Kristoffer
%A Schumacher, Mathias
%A Waser, Rainer
%A Nielen, Lutz
%T Advanced Electrical Characterization of Memristive Arrays for Neuromorphic Applications
%I IEEE
%M FZJ-2024-04698
%P 1
%D 2023
%B 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
%C 25 Oct 2023 - 27 Oct 2023, Milano (Italy)
Y2 25 Oct 2023 - 27 Oct 2023
M2 Milano, Italy
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceedings
%R 10.1109/MetroXRAINE58569.2023.10405805
%U https://juser.fz-juelich.de/record/1028625