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Advanced Electrical Characterization of Memristive Arrays for Neuromorphic Applications
Wiefels, S.FZJ* ; Liu, X. ; Schnieders, K.FZJ* ; Schumacher, M. ; Waser, R.FZJ* ; Nielen, L.
2023
IEEE
20232023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), MilanoMilano, Italy, 25 Oct 2023 - 27 Oct 20232023-10-252023-10-27
IEEE 1 pp. (2023) [10.1109/MetroXRAINE58569.2023.10405805]2023
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Please use a persistent id in citations: doi:10.1109/MetroXRAINE58569.2023.10405805
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
- JARA-FIT (JARA-FIT)
Research Program(s):
- 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
- BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) (BMBF-16ME0398K)
- BMBF 03ZU1106AA - NeuroSys: Memristor Crossbar Architekturen (Projekt A) - A (03ZU1106AA) (03ZU1106AA)
- BMBF 03ZU1106AB - NeuroSys: "Memristor Crossbar Architekturen (Projekt A) - B" (BMBF-03ZU1106AB) (BMBF-03ZU1106AB)
Appears in the scientific report
2024
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