TY  - CONF
AU  - Wiefels, Stefan
AU  - Liu, Xiaohua
AU  - Schnieders, Kristoffer
AU  - Schumacher, Mathias
AU  - Waser, Rainer
AU  - Nielen, Lutz
TI  - Advanced Electrical Characterization of Memristive Arrays for Neuromorphic Applications
PB  - IEEE
M1  - FZJ-2024-04698
SP  - 1
PY  - 2023
T2  - 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
CY  - 25 Oct 2023 - 27 Oct 2023, Milano (Italy)
Y2  - 25 Oct 2023 - 27 Oct 2023
M2  - Milano, Italy
LB  - PUB:(DE-HGF)8
DO  - DOI:10.1109/MetroXRAINE58569.2023.10405805
UR  - https://juser.fz-juelich.de/record/1028625
ER  -