%0 Conference Paper
%A Kopperberg, N.
%A Wiefels, Stefan
%A Hofmann, K.
%A Otterstedt, J.
%A Wouters, D. J.
%A Waser, R.
%A Menzel, Stephan
%T Experimental Characterization and 1D KMC-Based Simulation of the Reliability of 28 nm BEOL Integrated VCM ReRAM
%M FZJ-2024-04700
%D 2024
%B Materials Research Society Spring Meeting
%C 22 Apr 2024 - 26 Apr 2024, Seattle (USA)
Y2 22 Apr 2024 - 26 Apr 2024
M2 Seattle, USA
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/1028627